Quantitative secondary ion mass spectrometry (SIMS) of III-V materials
- 著者名:
- Van Lierde, P. ( Evans Analytical Groupe (USA) )
- Tian, C.
- Rothman, B.
- Hockett, R.A.
- 掲載資料名:
- Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4650
- 発行年:
- 2002
- 開始ページ:
- 229
- 終了ページ:
- 233
- 総ページ数:
- 5
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819443892 [0819443891]
- 言語:
- 英語
- 請求記号:
- P63600/4650
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
American Chemical Society |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
MRS - Materials Research Society |
Electrochemical Society |
SPIE - The International Society for Optical Engineering |
Materials Research Society | |
American Chemical Society |
Plenum Press |