Characterization of VCSELs model output using near-field scanning optical microscopy

Characterization of VCSELs model output using near-field scanning optical microscopy

著者名:

Bradford, W.C. ( Colorado School of Mines (USA) )
Beach, J.D.
Collins, R.T.
Kisker, D.W. ( Cielo Communications, Inc. (USA) )
Galt, D.

掲載資料名:

Vertical-Cavity Surface-Emitting Lasers VI

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4649

発行年:

2002

開始ページ:

77

終了ページ:

86

総ページ数:

10

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443885 [0819443883]

言語:

英語

請求記号:

P63600/4649

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012477
シリーズID:	PA00000029
会議名:	Photonics West - Optoelectronic Materials and Devices : Vertical-cavity surface-emitting lasers
回次:	2002 : 6th
会議開催地:	San Jose, CA, USA
会議開催年:	2002.01.23-2002.01.24

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