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Application of sub-ns pulsed LSDs in fluorescence lifetime spectroscopy

著者名:
掲載資料名:
Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4648
発行年:
2002
開始ページ:
171
終了ページ:
178
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443878 [0819443875]
言語:
英語
請求記号:
P63600/4648
資料種別:
国際会議録

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