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Long-wave IR chemical sensing based on difference frequency generation in orientation-patterned GaAs

著者名:
Bisson, S. E. ( Sandia National Labs.(USA) )
Kulp, T. L.
Bambha, R.
Armstrong, K.
Levi, O. ( Stanford Univ.(USA) )
Pinguet, T.
Eyres, L. A.
Fejer, M. M.
Harris, J. S.
さらに 4 件
掲載資料名:
Methods for ultrasensitive detection ll : 21-22 January 2002, San Jose, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4634
発行年:
2002
開始ページ:
78
終了ページ:
82
総ページ数:
5
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443731 [0819443735]
言語:
英語
請求記号:
P63600/4634
資料種別:
国際会議録

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