Growth and characterization of crack-free GaN films grown on crackd Si-doped GaN templates

Growth and characterization of crack-free GaN films grown on crackd Si-doped GaN templates

著者名:

Sia, E.K. ( Institute of Materials Research and Engineering (Singapore) )

Hao, M.S.

Chua, S.J.

Tiginyanu, I.M. ( Technical Univ. of Moldova )

Ichizli, V. ( Technische Univ. Darmstadt (Germany) )

Mutamba, K.

Hartnagel, H.L.

Zhang, J. ( National Univ. of Singapore )

Tripathy, S.

さらに 4 件

掲載資料名:

Design, fabrication, and characterization of photonic devices : 27-30 November 2001, Singapore

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4594

発行年:

2001

開始ページ:

201

終了ページ:

210

総ページ数:

10

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443243 [0819443247]

言語:

英語

請求記号:

P63600/4594

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012422
シリーズID:	PA00000029
会議名:	International Symposium on Photonics and Applications : Design, fabrication, and characterization of photonic devices
回次:	2001
会議開催地:	Singapore
会議開催年:	2001.11.27-2001.11.30

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2 国際会議録 Growth of Crack-Free GaN on AlN Quantum Dots on Si (111)Substrates by MOCVD Sun, W.H., Chen, J.L., Wang, L.S., Chua, S.J. Materials Research Society	8 国際会議録 Integration of InGaAs/InP PIN diodes with Fabry-Perot filters for wavelength-selective receivers Riemenschneider,R., Peerlings,J., Kumar,V.Naveen, Strassner,M., Pfeiffer,J., Mutamba,K., Herbst,S., Daleiden,J., … SPIE - The International Society for Optical Engineering
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