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Mobility spectrum techniques for characterizing multilayer semiconductors structures

著者名:
Musca, C.A. ( Univ. of Western Australia )
Nguyen, T.
Antoszewski, J.
Redfern, D.A.
Dell, J.M.
Faraone, L.
さらに 1 件
掲載資料名:
Design, characterization, and packaging for MEMS and microelectronics II : 17-19 December, 2001, Adelaide, Australia
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4593
発行年:
2001
開始ページ:
314
終了ページ:
321
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443236 [0819443239]
言語:
英語
請求記号:
P63600/4593
資料種別:
国際会議録

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