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Parameters study to improve sidewall roughness in advanced silicon etch process

著者名:
掲載資料名:
Device and process technologies for MEMS and Microelectronics II : 17-19 December 2001, Adelaide, Australia
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4592
発行年:
2001
開始ページ:
503
終了ページ:
513
総ページ数:
11
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443229 [0819443220]
言語:
英語
請求記号:
P63600/4592
資料種別:
国際会議録

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