High-Density, Low-Loss MOS Capacitors for Integrated RF Decoupling

High-Density, Low-Loss MOS Capacitors for Integrated RF Decoupling

著者名:

Roozeboom, F. ( Philips Research )

van den Meerakker, J.E.A.M.

さらに 1 件

掲載資料名:

Proceedings : International Symposium on Advanced Packaging Materials : processes, properties and interfaces, Chateau Elan, Braselton, Georgia, March 11-14, 2001

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4587

発行年:

2001

開始ページ:

477

終了ページ:

483

総ページ数:

7

出版情報:

Washington, DC: IMAPS

ISSN:

0277786X

ISBN:

9780930815646 [0930815645]

言語:

英語

請求記号:

P63600/4587

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012415
シリーズID:	PA00000029
会議名:	International Symposium on Advanced Packaging Materials
回次:	2001
会議開催地:	Braselton, Georgia, USA
会議開催年:	2001.03.11-2001.03.14

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