Evaluation system of negative electron affinity photocathode

Evaluation system of negative electron affinity photocathode

著者名:

Fu, R. ( Nanjing Univ. of Science and Technology (China) )
Chang, B.
Qian, Y.
Wang, G.
Zong, Z.

掲載資料名:

APOC 2001: Asia-Pacific Optical and Wireless Communications : Optoelectronics, Materials, and Dvices for Communications : 13-15 November 2001, Beijing, Chaina

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4580

発行年:

2001

開始ページ:

614

終了ページ:

622

総ページ数:

9

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443106 [0819443107]

言語:

英語

請求記号:

P63600/4580

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012408
シリーズID:	PA00000029
会議名:	APOC : Asia Communications and Photonics
回次:	2001
会議開催地:	Beijing, China
会議開催年:	2001.11.13-2001.11.15

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1 国際会議録 Spectral response and surface layer thickness of GaAs:Cs-O negative electron affinity photocathode Chang, B., Liu, W., Fu, R., Qian, Y., Zong, Z., Wang, G. SPIE-The International Society for Optical Engineering	7 国際会議録 Test of 1.06-μm photo detector of PIN photodiode Fu, R., Chang, B., Qian, Y., Zong, Z., Qiu, Y. SPIE - The International Society of Optical Engineering
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