Interpreting Scanning Tunneling and Atomic Force Microscopy Images
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Kluwer Academic Publishers |
7
国際会議録
Atomic-Scale Studies of Point Defects in Compound Semiconductors by Scanning Tunneling Microscopy
Trans Tech Publications |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
Kluwer Academic Publishers |
Materials Research Society |
10
国際会議録
True Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact Atomic Force Microscopy
MRS - Materials Research Society |
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
MRS - Materials Research Society |