Development of a phase (contrast) reversal speckle interferometric system for in-plane displacement measurement with two-fold sensitivity
- 著者名:
- Mohan,N.Krishna ( Indian Institute of Technology Madras )
- 掲載資料名:
- Optomechatronic systems II : 29-31 October 2001, Newton, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4564
- 発行年:
- 2001
- 開始ページ:
- 135
- 終了ページ:
- 143
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819442925 [0819442925]
- 言語:
- 英語
- 請求記号:
- P63600/4564
- 資料種別:
- 国際会議録
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