Characterization of an inchworm actuator fabricated by polysilicon surface micromachining
- 著者名:
- Boer,M.P.de ( Sandia National Labs. )
- Luck,D.L.
- Walraven,J.A.
- Redmond,J.M.
- 掲載資料名:
- Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4558
- 発行年:
- 2001
- 開始ページ:
- 169
- 終了ページ:
- 180
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819442864 [0819442860]
- 言語:
- 英語
- 請求記号:
- P63600/4558
- 資料種別:
- 国際会議録
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5
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Interferometric measurement for improved understanding of boundary effects in micromachined beams
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