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Young's modulus measurement of aluminum thin film with cantilever structure

著者名:
掲載資料名:
Micromachining and microfabrication process technology VII : 22-24 October 2001, San Francisco, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4557
発行年:
2001
開始ページ:
225
終了ページ:
232
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442857 [0819442852]
言語:
英語
請求記号:
P63600/4557
資料種別:
国際会議録

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