Blank Cover Image

Application research of the multifractal wavelet model in pattern recognition

著者名:
掲載資料名:
Image Matching and Analysis
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4552
発行年:
2001
開始ページ:
135
終了ページ:
139
総ページ数:
5
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442802 [0819442801]
言語:
英語
請求記号:
P63600/4552
資料種別:
国際会議録

類似資料:

Wang,R., Hua,T.J., Qin,W., Chen,G., Fu,Y., Guo,Q., Wang,J., Yu,B., Zhu,Z., Ruan,Z.

SPIE-The International Society for Optical Engineering

Chen,J., Zhou,H., O'yang,D., Buckley,S.

SPIE-The International Society for Optical Engineering

Isaacson,S.I., Gabbanelli,S.C., Busch,J.R.

SPIE-The International Society for Optical Engineering

Zhou, Z., Li, Q., Long, Q.

SPIE - The International Society of Optical Engineering

J.O. Chapa, R.M. Rao

Society of Photo-optical Instrumentation Engineers

Joo, W.-J., Choi, C.-S., Moon, I.K., Kim, N.

SPIE-The International Society for Optical Engineering

Smokelin,J.-S.

SPIE-The International Society for Optical Engineering

Zhang,Q., Yin,J.

SPIE-The International Society for Optical Engineering

J. Zhang, X. Zhou

Society of Photo-optical Instrumentation Engineers

Zhou, X., Zhou, K., Shi, J.-Y.

SPIE-The International Society for Optical Engineering

J. Gong, X. Yang, C. Zhou, D. Zhang

SPIE - The International Society of Optical Engineering

G. Yang, F. Peng, X. Li, K. Zhao, J. Chen

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12