Blank Cover Image

Local window approach to detect line segment based on line model in low-quality image

著者名:
掲載資料名:
Image Extraction, Segmentation, and Recognition
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4550
発行年:
2001
開始ページ:
217
終了ページ:
220
総ページ数:
4
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442789 [081944278X]
言語:
英語
請求記号:
P63600/4550
資料種別:
国際会議録

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