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Analysis of complex structures using a 3D x-ray tomography system with microfocus tube

著者名:
掲載資料名:
Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4503
発行年:
2001
開始ページ:
213
終了ページ:
221
総ページ数:
9
出版情報:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442178 [0819442178]
言語:
英語
請求記号:
P63600/4503
資料種別:
国際会議録

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