Blank Cover Image

Wireless SAW sensors for surface and subsurface sensing applications

著者名:
掲載資料名:
Subsurface and surface sensing technologies and applications III : 30 July-1 August 2001, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4491
発行年:
2001
巻:
4491
開始ページ:
358
終了ページ:
366
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442055 [0819442054]
言語:
英語
請求記号:
P63600/4491
資料種別:
国際会議録

類似資料:

Varadan,V.V., Tellakula,A.R., Hollinger,R.D., Li,C.-T., Varadan,V.K.

SPIE - The International Society for Optical Engineering

Z. Zhang, F. Seifert, R. Weigel

Society of Photo-optical Instrumentation Engineers

Zenkl, Ernst, Schimetta, Michael, Stelzer, Franz

American Chemical Society

W.J. Buttner, G. Chung, L. Evans, G. Hunter, J.R. Stetter

Electrochemical Society

Wieslaw Jakubik, Marian Urbañczyk, Stefan Cular, Venkat R. Bhethanabotla

American Institute of Chemical Engineers

Y. S. Shmaliy

Society of Photo-optical Instrumentation Engineers

Pichler, M., Stelzer, A., Fischer, A., Gulden, P., Weigel, R.

SPIE-The International Society for Optical Engineering

Randers-Eichhorn,L., Bartlett,R.A., Sipior,J., Frey,D.D., Carter,G.M., Lalowicz,J.R., Rao,G.

SPIE-The International Society for Optical Engineering

Sullivan, D.G., Shaw, J.N., Mask, P.L., Rickman, D., Luvall, J., Wersinger, J.M.

SPIE - The International Society of Optical Engineering

Stone, D.L., Cranney, J., Liang, R., Taya, M.

SPIE - The International Society of Optical Engineering

Stelzer, A., Pichler, M., Schuster, S., Scheiblhofer, S., Hauser, R.

SPIE-The International Society for Optical Engineering

Stefan Cular, Venkat R. Bhethanabotla, Darren W. Branch

American Institute of Chemical Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12