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Effects of nitrogen plasma immersion ion implantation in silicon

著者名:
掲載資料名:
Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4468
発行年:
2001
開始ページ:
131
終了ページ:
139
総ページ数:
9
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441829 [0819441821]
言語:
英語
請求記号:
P63600/4468
資料種別:
国際会議録

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