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RIE-induced n-on-p junction HgCdTe photodiodes: effects of passivant technology on bake stability

著者名:
Dell,J.M. ( Univ. of Western Australia )
Antoszewski,J.
White,J.K.
Pal,R.
Nguyen,T.
Musca,C.A.
Faraone,L.
さらに 2 件
掲載資料名:
Materials for infrared detectors : 30 July-1 August 2001, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4454
発行年:
2001
開始ページ:
106
終了ページ:
115
総ページ数:
10
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441683 [0819441686]
言語:
英語
請求記号:
P63600/4454
資料種別:
国際会議録

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