Correlation of test data from some NIF small optical components

Correlation of test data from some NIF small optical components

著者名:

Chow,R. ( Lawrence Livermore National Lab. )
McBurney,M.S.
Eickelberg,W.K.
Williams,W.H.
Thomas,M.D.

掲載資料名:

Optical manufacturing and testing IV : 31 July-2 August 2001, San Diego, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4451

発行年:

2001

開始ページ:

384

終了ページ:

393

総ページ数:

10

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819441652 [0819441651]

言語:

英語

請求記号:

P63600/4451

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012165
シリーズID:	PA00000029
会議名:	Optics & Photonics : Optical manufacturing and testing
回次:	2001 : 4th
会議開催地:	San Diego, CA, USA
会議開催年:	2001.07.31-2001.08.02

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