AMSD test error budget sensitivity analysis

AMSD test error budget sensitivity analysis

著者名:

Reardon,P.J. ( Ctr. for Applied Optics/Univ. of Alabama in Huntsville )

掲載資料名:

Optical manufacturing and testing IV : 31 July-2 August 2001, San Diego, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4451

発行年:

2001

開始ページ:

39

終了ページ:

50

総ページ数:

12

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819441652 [0819441651]

言語:

英語

請求記号:

P63600/4451

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012165
シリーズID:	PA00000029
会議名:	Optics & Photonics : Optical manufacturing and testing
回次:	2001 : 4th
会議開催地:	San Diego, CA, USA
会議開催年:	2001.07.31-2001.08.02

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