Effect of high-pressure high-temperature treatment on neutron-irradiation-induced defects in Czochralski silicon
- 著者名:
Londos,C.A. ( Univ. of Athens ) Fytros,L.G. Misiuk,A. Bak-Misiuk,J. Prujszczyk,M. Potsidou,M. - 掲載資料名:
- International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4412
- 発行年:
- 2000
- 開始ページ:
- 91
- 終了ページ:
- 96
- 総ページ数:
- 6
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819441157 [0819441155]
- 言語:
- 英語
- 請求記号:
- P63600/4412
- 資料種別:
- 国際会議録
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6
国際会議録
Effect of Annealing at High Hydrostatic Pressure of Silicon Implanted with Helium and Oxygen
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