Model-based testability assessment and directed troubleshooting of shuttle wiring systems

Model-based testability assessment and directed troubleshooting of shuttle wiring systems

著者名:

Deb,S. ( Qualtech Systems, Inc. )

掲載資料名:

Component and systems diagnostics, prognosis, and health management : 16-17 April 2001, Orlando, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4389

発行年:

2001

開始ページ:

163

終了ページ:

173

総ページ数:

11

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819440846 [0819440841]

言語:

英語

請求記号:

P63600/4389

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012105
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Component and systems diagnostics, prognosis, and health management
回次:	2001
会議開催地:	Orlando, FL, USA
会議開催年:	2001.04.16-2001.04.17

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