Angle-resolved scatter measurements of laser-damaged DKDP crystals using a bidirectional scatter diagnostics

Angle-resolved scatter measurements of laser-damaged DKDP crystals using a bidirectional scatter diagnostics

著者名:

Fluck,R. ( Lawrence Livermore National Lab. )
Wegner,P.J.
Sheehan,L.M.
Hackel,L.A.

掲載資料名:

Laser-induced damage in optical materials, 2000 : 32nd Annual Boulder Damage Symposium, proceedings, 16-18, October, 2000, Boulder, Colorado

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4347

発行年:

2000

開始ページ:

423

終了ページ:

431

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819440365 [0819440361]

言語:

英語

請求記号:

P63600/4347

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012063
シリーズID:	PA00000029
会議名:	Laser Damege : Laser-induced damage in optical materials - Annual Boulder Damage Symposium
回次:	2000 : 32nd
会議開催地:	Boulder, CO, USA
会議開催年:	2000.10.16-2000.10.18

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