Applicability of white light scanning interferometry for high-resolution characterization of surface defects
- 著者名:
- Kramb,V. ( Univ. of Dayton )
- Shell,E.B.
- Hoying,J.
- Simon,L.B.
- Meyendorf,N.
- 掲載資料名:
- Nondestructive Evaluation of Materials and Composites V
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4336
- 発行年:
- 2001
- 開始ページ:
- 135
- 終了ページ:
- 145
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819440228 [0819440221]
- 言語:
- 英語
- 請求記号:
- P63600/4336
- 資料種別:
- 国際会議録
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12
国際会議録
Instrumentation for speckle interferometry and techniques for investigating deformation and fracture
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