Sensitivity of atomic force microscope vibration modes to changes in surface stiffness
- 著者名:
- Wiehn,J.S. ( Univ. of Nebraska/Lincoln )
- Turner,J.A.
- 掲載資料名:
- Smart structures and materials 2001 : Sensory phenomena and measurement instrumentation for smart structures and materials : 5-6 March 2001, Newport Beach, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4328
- 発行年:
- 2001
- 開始ページ:
- 332
- 終了ページ:
- 341
- 総ページ数:
- 10
- 出版情報:
- Bellingham: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819440143 [0819440140]
- 言語:
- 英語
- 請求記号:
- P63600/4328
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
American Chemical Society |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
Kluwer Academic Publishers |
Kluwer Academic Publishers |
5
国際会議録
Inspecting the microprofile and defects of optical surfaces using an atomic-force microscope
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
American Society of Mechanical Engineers |
SPIE-The International Society for Optical Engineering |