Reliability assurance of broad-area high-power multimode laser diodes for telecommunications equipment

Reliability assurance of broad-area high-power multimode laser diodes for telecommunications equipment

著者名:

Pendse,D.R. ( Boston Laser, Inc. )
Chin,A.K.
Bull,D.
Maider,J.

掲載資料名:

Testing, Reliability, and Applications of Optoelectronic Devices

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4285

発行年:

2001

開始ページ:

1

終了ページ:

13

総ページ数:

13

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819439635 [0819439630]

言語:

英語

請求記号:

P63600/4285

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012001
シリーズID:	PA00000029
会議名:	Photonics West - Optoelectronic Materials and Devices : Testing, reliability, and applications of optoelectronic devices
回次:	2001
会議開催地:	San Jose, CA, USA
会議開催年:	2001.01.24-2001.01.26

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