Blank Cover Image

Evaluation of optical properties and micropatterning capabilities of a TPE microscope based on a compact confocal scanning head

著者名:
Diaspro,A. ( INFM )
Pellistri,F.
Federici,F.
Gerbi,A.
Ramoino,P.
Robello,M.
さらに 1 件
掲載資料名:
Multiphoton microscopy in the biomedical sciences, 21-23 January, 2001, San Jose, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4262
発行年:
2001
開始ページ:
383
終了ページ:
388
総ページ数:
6
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819439406 [0819439401]
言語:
英語
請求記号:
P63600/4262
資料種別:
国際会議録

類似資料:

Chirico,G., Cannone,F., Olivini,F., Beretta,S., Baldini,G., Diaspro,A., Robello,M.

SPIE-The International Society for Optical Engineering

Gale,D.M., Aguilar,J.F.

SPIE-The International Society for Optical Engineering

F. Beltrame, A. Diaspro, M. Fato, I. Martin, P. Ramoino

Society of Photo-optical Instrumentation Engineers

Kelly, K.F., Donhauser, Z.J., Mantooth, B.A., Weiss, P.S.

Kluwer Academic Publishers

Diaspro, A., Fronte, P., Raimondo, M., Fato, M., DeLeo, G., Beltrame, F., Cannone, F., Chiroco, G., Ramoino, P.

SPIE-The International Society for Optical Engineering

M. J. Mandella, J. T. C. Liu, W. Piyawattanametha, H. Ra, P. Hsiung, L. K. Wong, O. Solgaard, T. D. Wang, C. H. Contag, …

SPIE - The International Society of Optical Engineering

Beghuin, D., VandeVen, M., Ameloot, M., Claessens, D., Van Oostveldt, P.

SPIE - The International Society of Optical Engineering

Ribes, A. C., Damaskinos, S., Tiedje, H. F., Dixon, A. E., Brodie, D. E., Duttagupta, S. P., Fauchet, P. M.

MRS - Materials Research Society

Meilan,P.F., Caravaglia,M.

SPIE - The International Society for Optical Engineering

Diaspro, A., Krol, S., Silvano, D., Fronte, P., Cavalleri, O., Chirico, G., Beltrame, F., Ramoino, P., Gliozzi, A.

SPIE-The International Society for Optical Engineering

Shimoji,M.

SPIE-The International Society for Optical Engineering

Fu, S., Chia, T.C., Kwek, L.C., Diong, C.H., Tang, C.L., Choen, F.S., Krishnan, S.M.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12