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Processing technique for interference pattern with step using phase-shift interferometry

著者名:
掲載資料名:
Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4231
発行年:
2000
開始ページ:
371
終了ページ:
374
総ページ数:
4
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819439048 [0819439045]
言語:
英語
請求記号:
P63600/4231
資料種別:
国際会議録

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