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Novel algorithm for hot-carrier lifetime projection on thick gate PMOSFETs fabricated by 0.18-μm CMOS technology

著者名:
掲載資料名:
Microelectronic Yield, Reliability, and Advanced Packaging
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4229
発行年:
2000
開始ページ:
21
終了ページ:
27
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819439017 [0819439010]
言語:
英語
請求記号:
P63600/4229
資料種別:
国際会議録

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