Image-based recognition of the chip shape

Image-based recognition of the chip shape

著者名:

掲載資料名:

Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4221

発行年:

2000

開始ページ:

230

終了ページ:

233

総ページ数:

4

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819438928 [0819438928]

言語:

英語

請求記号:

P63600/4221

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00011940
シリーズID:	PA00000029
会議名:	Optics and Optoelectronic Inspection and Control : Optical measurement and nondestructive testing
回次:	2000
会議開催地:	Beijing, China
会議開催年:	2000.11.08-2000.11.10

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