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Resonance Ultrasonic Diagnostics of As-Grown and Process-Induced Defects in Cz Silicon

著者名:
Belyaev,A.
Tarasov,I.
Ostapenko,S.
Koveshnikov,S.
Kochelap,V.A.
Beyaev,A.E.
さらに 1 件
掲載資料名:
High Purity Silicon VI : proceedings of the sixth International Symposium
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4218
発行年:
2000
開始ページ:
660
終了ページ:
669
総ページ数:
10
出版情報:
Pennington, N.J. — Bellingham, Wash.: Electrochemical Society — SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9781566772846 [1566772842]
言語:
英語
請求記号:
P63600/4218
資料種別:
国際会議録

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