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Bulk and Surface Properties of Cz Silicon After Hydrogen Plasma Treatments

著者名:
Job,R.
Ulyashin,A.G.
Fahrner,W.R.
Markevich,V.P.
Murin,L.I.
Lindstrom,J.L.
Raiko,V.
Engemann,J.
さらに 3 件
掲載資料名:
High Purity Silicon VI : proceedings of the sixth International Symposium
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4218
発行年:
2000
開始ページ:
209
終了ページ:
220
総ページ数:
12
出版情報:
Pennington, N.J. — Bellingham, Wash.: Electrochemical Society — SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9781566772846 [1566772842]
言語:
英語
請求記号:
P63600/4218
資料種別:
国際会議録

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