Electrostatic discharge/electrical overstress susceptibility in MEMS: a new failure mode
- 著者名:
Walraven,J.A. Soden,J.M. Tanner,D.M. Tangyunyong,P. Cole Jr.,E.I. Anderson,R.E. Irwin,L.W. - 掲載資料名:
- MEMS Reliability for Critical Applications
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4180
- 発行年:
- 2000
- 開始ページ:
- 30
- 終了ページ:
- 39
- 総ページ数:
- 10
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819438362 [0819438367]
- 言語:
- 英語
- 請求記号:
- P63600/4180
- 資料種別:
- 国際会議録
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