Extended-wavelength InGaAs detectors grown by metal-organic vapor phase epitaxy (MOVPE) on compliant substrates
- 著者名:
- 掲載資料名:
- Sensors, systems, and next-generation satellites IV : 25-28 September 2000, Barcelona, Spain
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4169
- 発行年:
- 2000
- 開始ページ:
- 325
- 終了ページ:
- 336
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819438256 [0819438251]
- 言語:
- 英語
- 請求記号:
- P63600/4169
- 資料種別:
- 国際会議録
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Inerface Characterization of GaAs/Ge Heterostructure Grown by Metal-Organic Vapor-Phase Epitaxy
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