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XM-1: the high-resolution soft x-ray microscope at the Advanced Light Source

著者名:
Pearson,A.L.
Chao,W.
Denbeaux,G.
Eimueller,T.
Fischer,P.
Johnson,L.E.
Koehler,M.
Larabell,C.
Gros,M.A.Le
Yager,D.
Jr.,D.T.Attwood
さらに 6 件
掲載資料名:
Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4146
発行年:
2000
開始ページ:
54
終了ページ:
59
総ページ数:
6
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437914 [0819437913]
言語:
英語
請求記号:
P63600/4146
資料種別:
国際会議録

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