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Electrical compensation in CdTe and CdZnTe by intrisic defects

著者名:
Krsmanovic,N.
Lynn,K.G.
Weber,M.H.
Tjossem,R.
Awadalla,S.A.
Szeles,Cs.
Flint,P.J.
Glass,H.L.
さらに 3 件
掲載資料名:
Hard X-ray, gamma-ray, and neutron detector physics II : 31 July-2 August 2000, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4141
発行年:
2000
開始ページ:
219
終了ページ:
225
総ページ数:
7
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437860 [0819437867]
言語:
英語
請求記号:
P63600/4141
資料種別:
国際会議録

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