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Automated inspection of tellurium inclusions in cadmium zinc telluride (CdZnTe)

著者名:
Nelson,M.P.
Ribar,J.M.
Schweitzer,R.
Keitzer,S.A.
Treado,P.J.
Harris,K.A.
Reese,D.J.
さらに 2 件
掲載資料名:
Hard X-ray, gamma-ray, and neutron detector physics II : 31 July-2 August 2000, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4141
発行年:
2000
開始ページ:
194
終了ページ:
199
総ページ数:
6
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437860 [0819437867]
言語:
英語
請求記号:
P63600/4141
資料種別:
国際会議録

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