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High-resolution imaging microchannel plate detector for EUV spectrometry

著者名:
Bannister,N.P.
Lapington,J.S.
Barstow,M.A.
Fraser,G.W.
Sanderson,B.S.
Tandy,J.A.
Pearson,J.F.
Spragg,J.E.
さらに 3 件
掲載資料名:
X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4140
発行年:
2000
開始ページ:
199
終了ページ:
210
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437853 [0819437859]
言語:
英語
請求記号:
P63600/4140
資料種別:
国際会議録

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