Blank Cover Image

Sensitivity analysis of a CCD-based camera system for the retrieval of bidirectional reflectance distribution function for vicarious callbration

著者名:
掲載資料名:
Imaging spectrometry VI : 31 July - 2 August 2000, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4132
発行年:
2000
開始ページ:
279
終了ページ:
289
総ページ数:
11
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437778 [0819437778]
言語:
英語
請求記号:
P63600/4132
資料種別:
国際会議録

類似資料:

Nandy,P., Thome,K.J., Biggar,S.F.

SPIE - The International Society for Optical Engineering

Czapla-Myers,J.S., Thome,K.J., Biggar,S.F.

SPIE-The International Society for Optical Engineering

Thome, K.J., Czapla-Myers, J.S., Biggar, S.F.

SPIE-The International Society for Optical Engineering

Biggar,S.F., Thome,K.J., Spyak,P.R., Zalewski,E.F.

SPIE - The International Society for Optical Engineering

Kuester,M.A., Thome,K.J., Biggar,S.F., Krause,K.S.

SPIE-The International Society for Optical Engineering

Thome, K., Czapla-Myers, J., Biggar, S.

SPIE - The International Society of Optical Engineering

Anderson, N., Biggar, S.F., Burkhart, C.J., Thome, K.J., Mavko, M.

SPIE-The International Society for Optical Engineering

Garland, W.C., Biggar, S.F., Zalewski, E.F., Thome, K.J.

SPIE - The International Society of Optical Engineering

Thome,K.J., Whittington,E.E., Smith,N., Nandy,P., Zalewski,E.F.

SPIE-The International Society for Optical Engineering

P.N. Slater, S.F. Biggar, J.M. Palmer, K.J. Thome

Society of Photo-optical Instrumentation Engineers

Thome,K.J.

SPIE-The International Society for Optical Engineering

Thome,K.J., Biggar,S.F., Slater,P.N.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12