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Nondestructive film thickness measurement using atomic force microscopy at ultrasonic frequencles

著者名:
Crozier,K.B.
Yaralioglu,G.G.
Degertekin,F.L.
Adams,J.D.
Minne,S.C.
Quate,C.F.
さらに 1 件
掲載資料名:
Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4099
発行年:
2000
開始ページ:
48
終了ページ:
58
総ページ数:
11
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437440 [0819437441]
言語:
英語
請求記号:
P63600/4099
資料種別:
国際会議録

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