Production of a high-resolution spot for ellipsometric scanning immunology using an off-the-shelf ligh-emitting diode

Production of a high-resolution spot for ellipsometric scanning immunology using an off-the-shelf ligh-emitting diode

著者名:

掲載資料名:

Current developments in lens design and optical systems engineering : 2-4 August 2000, San Diego, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4093

発行年:

2000

開始ページ:

297

終了ページ:

308

総ページ数:

12

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819437389 [0819437387]

言語:

英語

請求記号:

P63600/4093

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00011828
シリーズID:	PA00000029
会議名:	Optics & Photonics : Current Developments in Lens Design and Optical Systems Engineering
回次:	2000
会議開催地:	San Diego, CA, USA
会議開催年:	2000.08.02-2008.08.04

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