Blank Cover Image

Conoscopic exam of diametrically loaded GRIN lenses

著者名:
掲載資料名:
Current developments in lens design and optical systems engineering : 2-4 August 2000, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4093
発行年:
2000
開始ページ:
68
終了ページ:
78
総ページ数:
11
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437389 [0819437387]
言語:
英語
請求記号:
P63600/4093
資料種別:
国際会議録

類似資料:

Tentori,D., Trevino-Martinez,F., Ayala-Diaz,C., Camacho,J., Mendieta-Jimenez,F.J.

SPIE-The International Society for Optical Engineering

Fischer, D.J., Moore, D.T.

SPIE-The International Society for Optical Engineering

Tentori,D., Camacho,J.

SPIE-The International Society for Optical Engineering

Tentori,D., Carrillo,V.K., Jimenez,J.Mendieta, Camacho,J., Alarcon,M.May, Ortiz,H.Soto

SPIE - The International Society for Optical Engineering

Tentori,D., Camacho,J.

SPIE - The International Society for Optical Engineering

Stepien,R., Kociszewski,L., Pysz,D.

SPIE-The International Society for Optical Engineering

Tentori,D., Camacho,J., Shlyagin,M., Miridonov,S.

SPIE-The International Society for Optical Engineering

Moneo,J.R.de F., Juvells,J.P., Vallmitjana,S.R., Bosch,S., Carnicer,A., Labastida,I., Perez,J.

SPIE-The International Society for Optical Engineering

5 国際会議録 GRIN PAL lenses feasibility

Vegas, J., Villuela, R., Fontdecaba, E., Dursteler, J.C.

SPIE - The International Society of Optical Engineering

Li, X.J., Yao, J.Q., Zhang, B.G.

SPIE-The International Society for Optical Engineering

Y.L. Lo, J.S. Sirkis, K.T. Ritchie

Society of Photo-optical Instrumentation Engineers

Okano, F., Kobayashi, M., Arai, J., Okui, M.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12