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Near-line inspector of optical disk parameters

著者名:
掲載資料名:
Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4085
発行年:
2000
開始ページ:
336
終了ページ:
339
総ページ数:
4
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437266 [0819437263]
言語:
英語
請求記号:
P63600/4085
資料種別:
国際会議録

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