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Atomic-Resolution Image of GaAs (110) Surface with an Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)

著者名:
Sugawara Y.
Ohta M.
Hontani K.
Morita S.
Osaka F.
Ohkouchi S.
Suzuki M.
Nagaoka H.
Mishima S.
Okada T.
さらに 5 件
掲載資料名:
Forces in scanning probe methods
シリーズ名:
NATO ASI series. Series E, Applied sciences
シリーズ巻号:
286
発行年:
1995
開始ページ:
501
終了ページ:
506
総ページ数:
6
出版情報:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792334064 [079233406X]
言語:
英語
請求記号:
N11482/286
資料種別:
国際会議録

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