Fermi level pinning at GaN-interfaces: Correlation of electrical admittance and transient spectroscopy
- 著者名:
Witte, H. Krtschil, A. Lisker, M. Rudloff, D. Christen, J. Krost, A. Stutzmann, M. Scholz, F. - 掲載資料名:
- GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 595
- 発行年:
- 2000
- 開始ページ:
- W11.82.1
- 出版情報:
- Warrendale, Pa.: MRS-Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558995031 [155899503X]
- 言語:
- 英語
- 請求記号:
- M23500/595
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
Trans Tech Publications |
Electrochemical Society |
MRS - Materials Research Society |
MRS-Materials Research Society |
MRS - Materials Research Society | |
5
国際会議録
Deep Defects in Fe-Doped GaN Layers Analysed by Electrical and Photoelectrical Spectroscopic Methods
Materials Research Society |
Trans Tech Publications |
Trans Tech Publications |
Electrochemical Society |