Characterization of diffusion length of minority carriers in(CdZn)Te at temperatures of 80 to 300 K
- 著者名:
Franc,J. ( Charles Univ.(Czech Republic) ) Belas,E. Hlidek,P. Toth,A.L. Sitter,H. Grill,R. Hoschl,P. Moravec,P. - 掲載資料名:
- Fourth International Conference on Material science and material properties for infrared optoelectronics : 29 September-2 October 1998, Kiev, Ukraine
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3890
- 発行年:
- 1999
- 開始ページ:
- 163
- 終了ページ:
- 169
- 出版情報:
- Bellingham, Washington: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819434913 [0819434914]
- 言語:
- 英語
- 請求記号:
- P63600/3890
- 資料種別:
- 国際会議録
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