Study of internal deformation fields in granular materials using 3D digital speckle x-ray flash photography
- 著者名:
- Grantham,S.G. ( Univ.of Cambridge )
- Proud,W.G.
- Goidrein,H.T.
- Field,J.E.
- 掲載資料名:
- Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4101
- 発行年:
- 2000
- 巻:
- Part B
- 開始ページ:
- 321
- 終了ページ:
- 329
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819437464 [0819437468]
- 言語:
- 英語
- 請求記号:
- P63600/4101
- 資料種別:
- 国際会議録
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