Blank Cover Image

Structural, optical and electrical characteristics of silicon carbon nitride

著者名:
Chen, L. C.
Wu, C. T.
Wen, C-Y.
Wu, J-J.
Liu, W. T.
Liu, C. W.
さらに 1 件
掲載資料名:
Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
592
発行年:
2000
開始ページ:
219
出版情報:
Warrendale, PA: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558995000 [1558995005]
言語:
英語
請求記号:
M23500/592
資料種別:
国際会議録

類似資料:

1 国際会議録 Silicon Carbon Nitride Films Deposited by ECR CVD

Chen, K-H., Wu, J.-J., Wen, C.-Y., Chen, L-C., Fan, C.-W, Kuo, P.-F., Chen, Y.-F., Huang, Y.-S.

Electrochemical Society
7 国際会議録 Diamondlike Carbon Film Properties from Optical and Electrical Measurements

Dalton, A., Kosel, P. B., Monreal, R., Fries-Carr, S., Weimer, J., Wu, R. L. C., Lanter, W.

MRS - Materials Research Society
2 国際会議録 Structural and Electrical Characteristics of Low Dielectric Cosntant Porous Hydrogen Silsequioxane for Cu Metallization

Wang, J.H., Liu, P.T., Chang, T.C., Chen, W.J., Cheng, S.L., Lin, J.Y., Chen, L.J.

Electrochemical Society
8 国際会議録 STRUCTURAL AND ELECTRICAL PROPERTIES OF TIN AND CARBON CO-IMPLANTED SILICON

Mei, P., Schmidt, M.T., Li, P.W., Yang, E.S., Wilkens, B.J.

Materials Research Society
3 国際会議録 Structural and Electrical Characteristics of Carbon Nanotubes Formed on Silicon Carbide Substrates by Surface Decomposition

Boeckl, J., Mitchel, W.C., Lu, W., Rigueur, J.

Trans Tech Publications
9 国際会議録 OPTICAL CHARACTERISTICS OF POROUS SILICON

Tischler, M.A., Collins, R.T., Tsang, J.C., Stathis, J.H., Batstone, J.L., Zollner, S.

Materials Research Society
4 国際会議録 THEORY OF STRUCTURAL AND ELECTRONIC PROPERTIES OF SILICON NITRIDE AND CARBON NITRIDE

Liu, A. Y., Cohen, M. L.

Materials Research Society
10 国際会議録 STRUCTURAL, OPTICAL, AND ELECTRICAL PROPERTIES OF AMORPHOUS HYDROGENATED CARBON NITRIDE

Han,. H.-X., Feldman, b. J.

Materials Research Society
5 国際会議録 Correlation of electrical, structural, and optical properties of erbium in silicon

Benton, J. L., Eaglesham, D. J., Almonte, M., Citrin, P. H., Marcus, M. A., Adler, D. L., Jacobson, D. C., Poate. J. M.

MRS - Materials Research Society
11 国際会議録 Electrical Characteristics of Low-Temperature Poly-Silicon Thin-Film Transistor Using a Stacked Pr2O3/SiOxNy Gate …

T. Pan, T. Wu, C. Chan, K. Chen, C. Lee

Electrochemical Society
6 国際会議録 CORRELATION OF ELECTRICAL, STRUCTURAL, AND OPTICAL PROPERTIES OF ERBIUM IN SILICON

Benton, J.L., Eaglesham, D.J., Almonte, M., Citrin, P.R., Marcus, M.A., Adler, D.L., Jacobson, D.C., Poate, J.M.

Materials Research Society
12 国際会議録 Electrical and Reliability Characteristics in Strained-Si MOSFETs

C. Yang, T. Pan, K. Chen, C. Liu

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12