Application of laser diode fiber alignment in measuring large-scale perpendicularity and parallelism

Application of laser diode fiber alignment in measuring large-scale perpendicularity and parallelism

著者名:

Hao,Q. ( Tsinghua Univ. )
Liang,R.
Cao,M.
Li,D.

掲載資料名:

Automated optical inspection for industry : 6-7 November 1996, Beijing, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2899

発行年:

1996

開始ページ:

2

終了ページ:

5

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819423009 [0819423009]

言語:

英語

請求記号:

P63600/2899

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020751
シリーズID:	PA00000029
会議名:	Photonics China : Automated optical inspection for industry
回次:	1996
会議開催地:	Beijing, China
会議開催年:	1996.11.06-1996.11.07

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